Enhancing Unsupervised Anomaly Detection with Score-Guided Network

Anomaly detection plays a crucial role in various real-world applications, including healthcare and finance systems. Owing to the limited number of anomaly labels in these complex systems, unsupervised anomaly detection methods have attracted great attention in recent years. Two major challenges faced by the existing unsupervised methods are: (i) distinguishing between normal and abnormal data in the transition field, where normal and abnormal data are highly mixed together; (ii) defining an effective metric to maximize the gap between normal and abnormal data in a hypothesis space, which is built by a representation learner. To that end, this work proposes a novel scoring network with a score-guided regularization to learn and enlarge the anomaly score disparities between normal and abnormal data. With such score-guided strategy, the representation learner can gradually learn more informative representation during the model training stage, especially for the samples in the transition field. We next propose a score-guided autoencoder (SG-AE), incorporating the scoring network into an autoencoder framework for anomaly detection, as well as other three state-of-the-art models, to further demonstrate the effectiveness and transferability of the design. Extensive experiments on both synthetic and real-world datasets demonstrate the state-of-the-art performance of these score-guided models (SGMs).

Cognitive Visual Inspection Service for LCD Manufacturing Industry

With the rapid growth of display devices, quality inspection via machine vision technology has become increasingly important for flat-panel displays (FPD) industry. This paper discloses a novel visual inspection system for liquid crystal display (LCD), which is currently a dominant type in the FPD industry. The system is based on two cornerstones: robust/high-performance defect recognition model and cognitive visual inspection service architecture. A hybrid application of conventional computer vision technique and the latest deep convolutional neural network (DCNN) leads to an integrated defect detection, classfication and impact evaluation model that can be economically trained with only image-level class annotations to achieve a high inspection accuracy. In addition, the properly trained model is robust to the variation of the image qulity, significantly alleviating the dependency between the model prediction performance and the image aquisition environment. This in turn justifies the decoupling of the defect recognition functions from the front-end device to the back-end serivce, motivating the design and realization of the cognitive visual inspection service architecture. Empirical case study is performed on a large-scale real-world LCD dataset from a manufacturing line with different layers and products, which shows the promising utility of our system, which has been deployed in a real-world LCD manufacturing line from a major player in the world.