Real-IAD D3: A Real-World 2D/Pseudo-3D/3D Dataset for Industrial Anomaly Detection

The increasing complexity of industrial anomaly detection (IAD) has positioned multimodal detection methods as a focal area of machine vision research. However, dedicated multimodal datasets specifically tailored for IAD remain limited. Pioneering datasets like MVTec 3D have laid essential groundwork in multimodal IAD by incorporating RGB+3D data, but still face challenges in bridging the gap with real industrial environments due to limitations in scale and resolution. To address these challenges, we introduce Real-IAD D3, a high-precision multimodal dataset that uniquely incorporates an additional pseudo3D modality generated through photometric stereo, alongside high-resolution RGB images and micrometer-level 3D point clouds. Real-IAD D3 features finer defects, diverse anomalies, and greater scale across 20 categories, providing a challenging benchmark for multimodal IAD Additionally, we introduce an effective approach that integrates RGB, point cloud, and pseudo-3D depth information to leverage the complementary strengths of each modality, enhancing detection performance. Our experiments highlight the importance of these modalities in boosting detection robustness and overall IAD performance. The dataset and code are publicly accessible for research purposes at https://realiad4ad.github.io/Real-IAD D3

DiffV2IR: Visible-to-Infrared Diffusion Model via Vision-Language Understanding

The task of translating visible-to-infrared images (V2IR) is inherently challenging due to three main obstacles: 1) achieving semantic-aware translation, 2) managing the diverse wavelength spectrum in infrared imagery, and 3) the scarcity of comprehensive infrared datasets. Current leading methods tend to treat V2IR as a conventional image-to-image synthesis challenge, often overlooking these specific issues. To address this, we introduce DiffV2IR, a novel framework for image translation comprising two key elements: a Progressive Learning Module (PLM) and a Vision-Language Understanding Module (VLUM). PLM features an adaptive diffusion model architecture that leverages multi-stage knowledge learning to infrared transition from full-range to target wavelength. To improve V2IR translation, VLUM incorporates unified Vision-Language Understanding. We also collected a large infrared dataset, IR-500K, which includes 500,000 infrared images compiled by various scenes and objects under various environmental conditions. Through the combination of PLM, VLUM, and the extensive IR-500K dataset, DiffV2IR markedly improves the performance of V2IR. Experiments validate DiffV2IR's excellence in producing high-quality translations, establishing its efficacy and broad applicability. The code, dataset, and DiffV2IR model will be available at https://github.com/LidongWang-26/DiffV2IR.

PA-CLIP: Enhancing Zero-Shot Anomaly Detection through Pseudo-Anomaly Awareness

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.