Data is all you need: Finetuning LLMs for Chip Design via an Automated design-data augmentation framework

Recent advances in large language models have demonstrated their potential for automated generation of hardware description language (HDL) code from high-level prompts. Researchers have utilized fine-tuning to enhance the ability of these large language models (LLMs) in the field of Chip Design. However, the lack of Verilog data hinders further improvement in the quality of Verilog generation by LLMs. Additionally, the absence of a Verilog and Electronic Design Automation (EDA) script data augmentation framework significantly increases the time required to prepare the training dataset for LLM trainers. This paper proposes an automated design-data augmentation framework, which generates high-volume and high-quality natural language aligned with Verilog and EDA scripts. For Verilog generation, it translates Verilog files to an abstract syntax tree and then maps nodes to natural language with a predefined template. For Verilog repair, it uses predefined rules to generate the wrong verilog file and then pairs EDA Tool feedback with the right and wrong verilog file. For EDA Script generation, it uses existing LLM(GPT-3.5) to obtain the description of the Script. To evaluate the effectiveness of our data augmentation method, we finetune Llama2-13B and Llama2-7B models using the dataset generated by our augmentation framework. The results demonstrate a significant improvement in the Verilog generation tasks with LLMs. Moreover, the accuracy of Verilog generation surpasses that of the current state-of-the-art open-source Verilog generation model, increasing from 58.8% to 70.6% with the same benchmark. Our 13B model (ChipGPT-FT) has a pass rate improvement compared with GPT-3.5 in Verilog generation and outperforms in EDA script (i.e., SiliconCompiler) generation with only 200 EDA script data.

Adaptive Reconvergence-driven AIG Rewriting via Strategy Learning

Rewriting is a common procedure in logic synthesis aimed at improving the performance, power, and area (PPA) of circuits. The traditional reconvergence-driven And-Inverter Graph (AIG) rewriting method focuses solely on optimizing the reconvergence cone through Boolean algebra minimization. However, there exist opportunities to incorporate other node-rewriting algorithms that are better suited for specific cones. In this paper, we propose an adaptive reconvergence-driven AIG rewriting algorithm that combines two key techniques: multi-strategy-based AIG rewriting and strategy learning-based algorithm selection. The multi-strategy-based rewriting method expands upon the traditional approach by incorporating support for multi-node-rewriting algorithms, thus expanding the optimization space. Additionally, the strategy learning-based algorithm selection method determines the most suitable node-rewriting algorithm for a given cone. Experimental results demonstrate that our proposed method yields a significant average improvement of 5.567\% in size and 5.327\% in depth.

Cross-Layer Optimization for Fault-Tolerant Deep Learning

Fault-tolerant deep learning accelerator is the basis for highly reliable deep learning processing and critical to deploy deep learning in safety-critical applications such as avionics and robotics. Since deep learning is known to be computing- and memory-intensive, traditional fault-tolerant approaches based on redundant computing will incur substantial overhead including power consumption and chip area. To this end, we propose to characterize deep learning vulnerability difference across both neurons and bits of each neuron, and leverage the vulnerability difference to enable selective protection of the deep learning processing components from the perspective of architecture layer and circuit layer respectively. At the same time, we observe the correlation between model quantization and bit protection overhead of the underlying processing elements of deep learning accelerators, and propose to reduce the bit protection overhead by adding additional quantization constrain without compromising the model accuracy. Finally, we employ Bayesian optimization strategy to co-optimize the correlated cross-layer design parameters at algorithm layer, architecture layer, and circuit layer to minimize the hardware resource consumption while fulfilling multiple user constraints including reliability, accuracy, and performance of the deep learning processing at the same time.

Fast Exact NPN Classification with Influence-aided Canonical Form

NPN classification has many applications in the synthesis and verification of digital circuits. The canonical-form-based method is the most common approach, designing a canonical form as representative for the NPN equivalence class first and then computing the transformation function according to the canonical form. Most works use variable symmetries and several signatures, mainly based on the cofactor, to simplify the canonical form construction and computation. This paper describes a novel canonical form and its computation algorithm by introducing Boolean influence to NPN classification, which is a basic concept in analysis of Boolean functions. We show that influence is input-negation-independent, input-permutation-dependent, and has other structural information than previous signatures for NPN classification. Therefore, it is a significant ingredient in speeding up NPN classification. Experimental results prove that influence plays an important role in reducing the transformation enumeration in computing the canonical form. Compared with the state-of-the-art algorithm implemented in ABC, our influence-aided canonical form for exact NPN classification gains up to 5.5x speedup.

Exploring Winograd Convolution for Cost-effective Neural Network Fault Tolerance

Winograd is generally utilized to optimize convolution performance and computational efficiency because of the reduced multiplication operations, but the reliability issues brought by winograd are usually overlooked. In this work, we observe the great potential of winograd convolution in improving neural network (NN) fault tolerance. Based on the observation, we evaluate winograd convolution fault tolerance comprehensively from different granularities ranging from models, layers, and operation types for the first time. Then, we explore the use of inherent fault tolerance of winograd convolution for cost-effective NN protection against soft errors. Specifically, we mainly investigate how winograd convolution can be effectively incorporated with classical fault-tolerant design approaches including triple modular redundancy (TMR), fault-aware retraining, and constrained activation functions. According to our experiments, winograd convolution can reduce the fault-tolerant design overhead by 55.77\% on average without any accuracy loss compared to standard convolution, and further reduce the computing overhead by 17.24\% when the inherent fault tolerance of winograd convolution is considered. When it is applied on fault-tolerant neural networks enhanced with fault-aware retraining and constrained activation functions, the resulting model accuracy generally shows significant improvement in presence of various faults.

MRFI: An Open Source Multi-Resolution Fault Injection Framework for Neural Network Processing

To ensure resilient neural network processing on even unreliable hardware, comprehensive reliability analysis against various hardware faults is generally required before the deep neural network models are deployed, and efficient error injection tools are highly demanded. However, most existing fault injection tools remain rather limited to basic fault injection to neurons and fail to provide fine-grained vulnerability analysis capability. In addition, many of the fault injection tools still need to change the neural network models and make the fault injection closely coupled with normal neural network processing, which further complicates the use of the fault injection tools and slows down the fault simulation. In this work, we propose MRFI, a highly configurable multi-resolution fault injection tool for deep neural networks. It enables users to modify an independent fault configuration file rather than neural network models for the fault injection and vulnerability analysis. Particularly, it integrates extensive fault analysis functionalities from different perspectives and enables multi-resolution investigation of the vulnerability of neural networks. In addition, it does not modify the major neural network computing framework of PyTorch. Hence, it allows parallel processing on GPUs naturally and exhibits fast fault simulation according to our experiments.

ChipGPT: How far are we from natural language hardware design

As large language models (LLMs) like ChatGPT exhibited unprecedented machine intelligence, it also shows great performance in assisting hardware engineers to realize higher-efficiency logic design via natural language interaction. To estimate the potential of the hardware design process assisted by LLMs, this work attempts to demonstrate an automated design environment that explores LLMs to generate hardware logic designs from natural language specifications. To realize a more accessible and efficient chip development flow, we present a scalable four-stage zero-code logic design framework based on LLMs without retraining or finetuning. At first, the demo, ChipGPT, begins by generating prompts for the LLM, which then produces initial Verilog programs. Second, an output manager corrects and optimizes these programs before collecting them into the final design space. Eventually, ChipGPT will search through this space to select the optimal design under the target metrics. The evaluation sheds some light on whether LLMs can generate correct and complete hardware logic designs described by natural language for some specifications. It is shown that ChipGPT improves programmability, and controllability, and shows broader design optimization space compared to prior work and native LLMs alone.

Statistical Modeling of Soft Error Influence on Neural Networks

Soft errors in large VLSI circuits pose dramatic influence on computing- and memory-intensive neural network (NN) processing. Understanding the influence of soft errors on NNs is critical to protect against soft errors for reliable NN processing. Prior work mainly rely on fault simulation to analyze the influence of soft errors on NN processing. They are accurate but usually specific to limited configurations of errors and NN models due to the prohibitively slow simulation speed especially for large NN models and datasets. With the observation that the influence of soft errors propagates across a large number of neurons and accumulates as well, we propose to characterize the soft error induced data disturbance on each neuron with normal distribution model according to central limit theorem and develop a series of statistical models to analyze the behavior of NN models under soft errors in general. The statistical models reveal not only the correlation between soft errors and NN model accuracy, but also how NN parameters such as quantization and architecture affect the reliability of NNs. The proposed models are compared with fault simulation and verified comprehensively. In addition, we observe that the statistical models that characterize the soft error influence can also be utilized to predict fault simulation results in many cases and we explore the use of the proposed statistical models to accelerate fault simulations of NNs. According to our experiments, the accelerated fault simulation shows almost two orders of magnitude speedup with negligible simulation accuracy loss over the baseline fault simulations.

Fault-Tolerant Deep Learning: A Hierarchical Perspective

With the rapid advancements of deep learning in the past decade, it can be foreseen that deep learning will be continuously deployed in more and more safety-critical applications such as autonomous driving and robotics. In this context, reliability turns out to be critical to the deployment of deep learning in these applications and gradually becomes a first-class citizen among the major design metrics like performance and energy efficiency. Nevertheless, the back-box deep learning models combined with the diverse underlying hardware faults make resilient deep learning extremely challenging. In this special session, we conduct a comprehensive survey of fault-tolerant deep learning design approaches with a hierarchical perspective and investigate these approaches from model layer, architecture layer, circuit layer, and cross layer respectively.

R2F: A Remote Retraining Framework for AIoT Processors with Computing Errors

AIoT processors fabricated with newer technology nodes suffer rising soft errors due to the shrinking transistor sizes and lower power supply. Soft errors on the AIoT processors particularly the deep learning accelerators (DLAs) with massive computing may cause substantial computing errors. These computing errors are difficult to be captured by the conventional training on general purposed processors like CPUs and GPUs in a server. Applying the offline trained neural network models to the edge accelerators with errors directly may lead to considerable prediction accuracy loss. To address the problem, we propose a remote retraining framework (R2F) for remote AIoT processors with computing errors. It takes the remote AIoT processor with soft errors in the training loop such that the on-site computing errors can be learned with the application data on the server and the retrained models can be resilient to the soft errors. Meanwhile, we propose an optimized partial TMR strategy to enhance the retraining. According to our experiments, R2F enables elastic design trade-offs between the model accuracy and the performance penalty. The top-5 model accuracy can be improved by 1.93%-13.73% with 0%-200% performance penalty at high fault error rate. In addition, we notice that the retraining requires massive data transmission and even dominates the training time, and propose a sparse increment compression approach for the data transmission optimization, which reduces the retraining time by 38%-88% on average with negligible accuracy loss over a straightforward remote retraining.