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Noriko Kando

Test Collections for Patent-to-Patent Retrieval and Patent Map Generation in NTCIR-4 Workshop



Atsushi Fujii , Makoto Iwayama , Noriko Kando

Figure 1 for Test Collections for Patent-to-Patent Retrieval and Patent Map Generation in NTCIR-4 Workshop
* Proceedings of the 4th International Conference on Language Resources and Evaluation (LREC-2004), pp.1643-1646, May. 2004. 
 * 4 pages, Proceedings of the 4th International Conference on Language Resources and Evaluation (to appear) 
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