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Attacking Split Manufacturing from a Deep Learning Perspective

Jul 08, 2020
Haocheng Li, Satwik Patnaik, Abhrajit Sengupta, Haoyu Yang, Johann Knechtel, Bei Yu, Evangeline F. Y. Young, Ozgur Sinanoglu

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Are Adversarial Perturbations a Showstopper for ML-Based CAD? A Case Study on CNN-Based Lithographic Hotspot Detection

Jun 25, 2019
Kang Liu, Haoyu Yang, Yuzhe Ma, Benjamin Tan, Bei Yu, Evangeline F. Y. Young, Ramesh Karri, Siddharth Garg

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