SuperAD: A Training-free Anomaly Classification and Segmentation Method for CVPR 2025 VAND 3.0 Workshop Challenge Track 1: Adapt & Detect

In this technical report, we present our solution to the CVPR 2025 Visual Anomaly and Novelty Detection (VAND) 3.0 Workshop Challenge Track 1: Adapt & Detect: Robust Anomaly Detection in Real-World Applications. In real-world industrial anomaly detection, it is crucial to accurately identify anomalies with physical complexity, such as transparent or reflective surfaces, occlusions, and low-contrast contaminations. The recently proposed MVTec AD 2 dataset significantly narrows the gap between publicly available benchmarks and anomalies found in real-world industrial environments. To address the challenges posed by this dataset--such as complex and varying lighting conditions and real anomalies with large scale differences--we propose a fully training-free anomaly detection and segmentation method based on feature extraction using the DINOv2 model named SuperAD. Our method carefully selects a small number of normal reference images and constructs a memory bank by leveraging the strong representational power of DINOv2. Anomalies are then segmented by performing nearest neighbor matching between test image features and the memory bank. Our method achieves competitive results on both test sets of the MVTec AD 2 dataset.

ChipExpert: The Open-Source Integrated-Circuit-Design-Specific Large Language Model

The field of integrated circuit (IC) design is highly specialized, presenting significant barriers to entry and research and development challenges. Although large language models (LLMs) have achieved remarkable success in various domains, existing LLMs often fail to meet the specific needs of students, engineers, and researchers. Consequently, the potential of LLMs in the IC design domain remains largely unexplored. To address these issues, we introduce ChipExpert, the first open-source, instructional LLM specifically tailored for the IC design field. ChipExpert is trained on one of the current best open-source base model (Llama-3 8B). The entire training process encompasses several key stages, including data preparation, continue pre-training, instruction-guided supervised fine-tuning, preference alignment, and evaluation. In the data preparation stage, we construct multiple high-quality custom datasets through manual selection and data synthesis techniques. In the subsequent two stages, ChipExpert acquires a vast amount of IC design knowledge and learns how to respond to user queries professionally. ChipExpert also undergoes an alignment phase, using Direct Preference Optimization, to achieve a high standard of ethical performance. Finally, to mitigate the hallucinations of ChipExpert, we have developed a Retrieval-Augmented Generation (RAG) system, based on the IC design knowledge base. We also released the first IC design benchmark ChipICD-Bench, to evaluate the capabilities of LLMs across multiple IC design sub-domains. Through comprehensive experiments conducted on this benchmark, ChipExpert demonstrated a high level of expertise in IC design knowledge Question-and-Answer tasks.