Adaptive coded illumination Fourier ptychography microscopy based on physical neural network

Fourier Ptychographic Microscopy (FPM) is a computational technique that achieves a large space-bandwidth product imaging. It addresses the challenge of balancing a large field of view and high resolution by fusing information from multiple images taken with varying illumination angles. Nevertheless, conventional FPM framework always suffers from long acquisition time and a heavy computational burden. In this paper, we propose a novel physical neural network that generates an adaptive illumination mode by incorporating temporally-encoded illumination modes as a distinct layer, aiming to improve the acquisition and calculation efficiency. Both simulations and experiments have been conducted to validate the feasibility and effectiveness of the proposed method. It is worth mentioning that, unlike previous works that obtain the intensity of a multiplexed illumination by post-combination of each sequentially illuminated and obtained low-resolution images, our experimental data is captured directly by turning on multiple LEDs with a coded illumination pattern. Our method has exhibited state-of-the-art performance in terms of both detail fidelity and imaging velocity when assessed through a multitude of evaluative aspects.

Robust full-pose-parameter estimation for the LED array in Fourier ptychographic microscopy

Fourier ptychographic microscopy (FPM) can achieve quantitative phase imaging with a large space-bandwidth product by synthesizing a set of low-resolution intensity images captured under angularly varying illuminations. Determining accurate illumination angles is critical because the consistency between actual systematic parameters and those used in the recovery algorithm is essential for high-quality imaging. This paper presents a full-pose-parameter and physics-based method for calibrating illumination angles. Using a physics-based model constructed with general knowledge of the employed microscope and the brightfield-to-darkfield boundaries inside captured images, we can solve for the full-pose parameters of misplaced LED array, which consist of the distance between the sample and the LED array, two orthogonal lateral shifts, one in-plane rotation angle, and two tilt angles, to correct illumination angles precisely. The feasibility and effectiveness of the proposed method for recovering random or remarkable pose parameters have been demonstrated by both qualitative and quantitative experiments. Due to the completeness of the pose parameters, the clarity of the physical model, and the high robustness for arbitrary misalignments, our method can significantly facilitate the design, implementation, and application of concise and robust FPM platforms.

Fourier ptychography multi-parameter neural network with composite physical priori optimization

Fourier ptychography microscopy(FP) is a recently developed computational imaging approach for microscopic super-resolution imaging. By turning on each light-emitting-diode (LED) located on different position on the LED array sequentially and acquiring the corresponding images that contain different spatial frequency components, high spatial resolution and quantitative phase imaging can be achieved in the case of large field-of-view. Nevertheless, FPM has high requirements for the system construction and data acquisition processes, such as precise LEDs position, accurate focusing and appropriate exposure time, which brings many limitations to its practical applications. In this paper, inspired by artificial neural network, we propose a Fourier ptychography multi-parameter neural network (FPMN) with composite physical prior optimization. A hybrid parameter determination strategy combining physical imaging model and data-driven network training is proposed to recover the multi layers of the network corresponding to different physical parameters, including sample complex function, system pupil function, defocus distance, LED array position deviation and illumination intensity fluctuation, etc. Among these parameters, LED array position deviation is recovered based on the features of brightfield to darkfield transition low-resolution images while the others are recovered in the process of training of the neural network. The feasibility and effectiveness of FPMN are verified through simulations and actual experiments. Therefore FPMN can evidently reduce the requirement for practical applications of FPM.