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Christopher Syben

Pattern Recognition Lab, Department of Computer Science, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen, Germany

Data-driven Modeling in Metrology -- A Short Introduction, Current Developments and Future Perspectives

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Jun 24, 2024
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StyleX: A Trainable Metric for X-ray Style Distances

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May 23, 2024
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The Artificial Neural Twin -- Process Optimization and Continual Learning in Distributed Process Chains

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Mar 27, 2024
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Task-based Generation of Optimized Projection Sets using Differentiable Ranking

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Mar 21, 2023
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Optimizing CT Scan Geometries With and Without Gradients

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Feb 13, 2023
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Geometric Constraints Enable Self-Supervised Sinogram Inpainting in Sparse-View Tomography

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Feb 13, 2023
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Is Medical Chest X-ray Data Anonymous?

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Mar 15, 2021
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X-ray Scatter Estimation Using Deep Splines

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Jan 22, 2021
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Reconstruction of Voxels with Position- and Angle-Dependent Weightings

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Oct 27, 2020
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Cephalogram Synthesis and Landmark Detection in Dental Cone-Beam CT Systems

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Sep 09, 2020
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