Prediction of the electron density of states for crystalline compounds with Atomistic Line Graph Neural Networks (ALIGNN)

Machine learning (ML) based models have greatly enhanced the traditional materials discovery and design pipeline. Specifically, in recent years, surrogate ML models for material property prediction have demonstrated success in predicting discrete scalar-valued target properties to within reasonable accuracy of their DFT-computed values. However, accurate prediction of spectral targets such as the electron Density of States (DOS) poses a much more challenging problem due to the complexity of the target, and the limited amount of available training data. In this study, we present an extension of the recently developed Atomistic Line Graph Neural Network (ALIGNN) to accurately predict DOS of a large set of material unit cell structures, trained to the publicly available JARVIS-DFT dataset. Furthermore, we evaluate two methods of representation of the target quantity - a direct discretized spectrum, and a compressed low-dimensional representation obtained using an autoencoder. Through this work, we demonstrate the utility of graph-based featurization and modeling methods in the prediction of complex targets that depend on both chemistry and directional characteristics of material structures.

Harvesting data revolution for transmission electron microscopy (TEM) using signal processing

TEM (Transmission Electron Microscopy) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. This challenge requires the development of new data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this paper, we highlight a few areas that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook in opportunities of integrating signal processing with automated TEM data analysis.

Recurrent Localization Networks applied to the Lippmann-Schwinger Equation

The bulk of computational approaches for modeling physical systems in materials science derive from either analytical (i.e. physics based) or data-driven (i.e. machine-learning based) origins. In order to combine the strengths of these two approaches, we advance a novel machine learning approach for solving equations of the generalized Lippmann-Schwinger (L-S) type. In this paradigm, a given problem is converted into an equivalent L-S equation and solved as an optimization problem, where the optimization procedure is calibrated to the problem at hand. As part of a learning-based loop unrolling, we use a recurrent convolutional neural network to iteratively solve the governing equations for a field of interest. This architecture leverages the generalizability and computational efficiency of machine learning approaches, but also permits a physics-based interpretation. We demonstrate our learning approach on the two-phase elastic localization problem, where it achieves excellent accuracy on the predictions of the local (i.e., voxel-level) elastic strains. Since numerous governing equations can be converted into an equivalent L-S form, the proposed architecture has potential applications across a range of multiscale materials phenomena.