Tool Verification for Test-Time Reinforcement Learning

Test-time reinforcement learning (TTRL) has emerged as a promising paradigm for self-evolving large reasoning models (LRMs), enabling online adaptation on unlabeled test inputs via self-induced rewards through majority voting. However, a spurious yet high-frequency unverified consensus can become a biased and reinforced reward signal, leading to incorrect mode collapse. We address this failure mode with T^3RL (Tool-Verification for Test-Time Reinforcement Learning), which introduces test-time tool verification into reward estimation. Concretely, a verifier uses an external tool as evidence (e.g., from code execution) to upweight verified rollouts in a verification-aware voting, producing more reliable pseudo-labels for training. Across various math difficulties (MATH-500, AMC, and AIME 2024) and diverse backbone types, T^3RL significantly improves over TTRL, with larger gains on harder problems. More broadly, T^3RL can be viewed as verified online data synthesis, highlighting test-time tool verification as a key mechanism for stabilizing self-evolution.

Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics

Whereas in general computer vision, transformer-based architectures have quickly become the gold standard, microelectronics defect detection still heavily relies on convolutional neural networks (CNNs). We hypothesize that this is due to the fact that a) transformers have an increased need for data and b) labelled image generation procedures for microelectronics are costly, and labelled data is therefore sparse. Whereas in other domains, pre-training on large natural image datasets can mitigate this problem, in microelectronics transfer learning is hindered due to the dissimilarity of domain data and natural images. Therefore, we evaluate self pre-training, where models are pre-trained on the target dataset, rather than another dataset. We propose a vision transformer (ViT) pre-training framework for defect detection in microelectronics based on masked autoencoders (MAE). In MAE, a large share of image patches is masked and reconstructed by the model during pre-training. We perform pre-training and defect detection using a dataset of less than 10.000 scanning acoustic microscopy (SAM) images labelled using transient thermal analysis (TTA). Our experimental results show that our approach leads to substantial performance gains compared to a) supervised ViT, b) ViT pre-trained on natural image datasets, and c) state-of-the-art CNN-based defect detection models used in the literature. Additionally, interpretability analysis reveals that our self pre-trained models, in comparison to ViT baselines, correctly focus on defect-relevant features such as cracks in the solder material. This demonstrates that our approach yields fault-specific feature representations, making our self pre-trained models viable for real-world defect detection in microelectronics.