Bootstrapping the Cross-Validation Estimate

Cross-validation is a widely used technique for evaluating the performance of prediction models. It helps avoid the optimism bias in error estimates, which can be significant for models built using complex statistical learning algorithms. However, since the cross-validation estimate is a random value dependent on observed data, it is essential to accurately quantify the uncertainty associated with the estimate. This is especially important when comparing the performance of two models using cross-validation, as one must determine whether differences in error estimates are a result of chance fluctuations. Although various methods have been developed for making inferences on cross-validation estimates, they often have many limitations, such as stringent model assumptions This paper proposes a fast bootstrap method that quickly estimates the standard error of the cross-validation estimate and produces valid confidence intervals for a population parameter measuring average model performance. Our method overcomes the computational challenge inherent in bootstrapping the cross-validation estimate by estimating the variance component within a random effects model. It is just as flexible as the cross-validation procedure itself. To showcase the effectiveness of our approach, we employ comprehensive simulations and real data analysis across three diverse applications.

Improvement of image classification by multiple optical scattering

Multiple optical scattering occurs when light propagates in a non-uniform medium. During the multiple scattering, images were distorted and the spatial information they carried became scrambled. However, the image information is not lost but presents in the form of speckle patterns (SPs). In this study, we built up an optical random scattering system based on an LCD and an RGB laser source. We found that the image classification can be improved by the help of random scattering which is considered as a feedforward neural network to extracts features from image. Along with the ridge classification deployed on computer, we achieved excellent classification accuracy higher than 94%, for a variety of data sets covering medical, agricultural, environmental protection and other fields. In addition, the proposed optical scattering system has the advantages of high speed, low power consumption, and miniaturization, which is suitable for deploying in edge computing applications.