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Kevin G. Field

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Performance, Successes and Limitations of Deep Learning Semantic Segmentation of Multiple Defects in Transmission Electron Micrographs

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Oct 15, 2021
Ryan Jacobs, Mingren Shen, Yuhan Liu, Wei Hao, Xiaoshan Li, Ruoyu He, Jacob RC Greaves, Donglin Wang, Zeming Xie, Zitong Huang, Chao Wang, Kevin G. Field, Dane Morgan

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A Deep Learning Based Automatic Defect Analysis Framework for In-situ TEM Ion Irradiations

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Aug 19, 2021
Mingren Shen, Guanzhao Li, Dongxia Wu, Yudai Yaguchi, Jack C. Haley, Kevin G. Field, Dane Morgan

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