Out-of-distribution (OOD) detection empowers the model trained on the closed set to identify unknown data in the open world. Though many prior techniques have yielded considerable improvements, two crucial obstacles still remain. Firstly, a unified perspective has yet to be presented to view the developed arts with individual designs, which is vital for providing insights into the related directions. Secondly, most research focuses on the post-processing schemes of the pre-trained features while disregarding the superiority of end-to-end training, dramatically limiting the upper bound of OOD detection. To tackle these issues, we propose a general probabilistic framework to interpret many existing methods and an OOD-data-free model, namely Self-supervised Sampling for OOD Detection (SSOD), to unfold the potential of end-to-end learning. SSOD efficiently exploits natural OOD signals from the in-distribution (ID) data based on the local property of convolution. With these supervisions, it jointly optimizes the OOD detection and conventional ID classification. Extensive experiments reveal that SSOD establishes competitive state-of-the-art performance on many large-scale benchmarks, where it outperforms the most recent approaches, such as KNN, by a large margin, e.g., 48.99% to 35.52% on SUN at FPR95.