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Reducing Class Collapse in Metric Learning with Easy Positive Sampling

Jun 09, 2020
Elad Levi, Tete Xiao, Xiaolong Wang, Trevor Darrell



Metric learning seeks perceptual embeddings where visually similar instances are close and dissimilar instances are apart, but learn representation can be sub-optimal when the distribution of intra-class samples is diverse and distinct sub-clusters are present. We theoretically prove and empirically show that under reasonable noise assumptions, prevalent embedding losses in metric learning, e.g., triplet loss, tend to project all samples of a class with various modes onto a single point in the embedding space, resulting in class collapse that usually renders the space ill-sorted for classification or retrieval. To address this problem, we propose a simple modification to the embedding losses such that each sample selects its nearest same-class counterpart in a batch as the positive element in the tuple. This allows for the presence of multiple sub-clusters within each class. The adaptation can be integrated into a wide range of metric learning losses. Our method demonstrates clear benefits on various fine-grained image retrieval datasets over a variety of existing losses; qualitative retrieval results show that samples with similar visual patterns are indeed closer in the embedding space.



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