Abstract:X-ray ptychography provides exceptional nanoscale resolution and is widely applied in materials science, biology, and nanotechnology. However, its full potential is constrained by the critical challenge of accurately reconstructing images when the illuminating probe is unknown. Conventional iterative methods and deep learning approaches are often suboptimal, particularly under the low-signal conditions inherent to low-dose and high-speed experiments. These limitations compromise reconstruction fidelity and restrict the broader adoption of the technique. In this work, we introduce the Ptychographic Implicit Neural Representation (PtyINR), a self-supervised framework that simultaneously addresses the object and probe recovery problem. By parameterizing both as continuous neural representations, PtyINR performs end-to-end reconstruction directly from raw diffraction patterns without requiring any pre-characterization of the probe. Extensive evaluations demonstrate that PtyINR achieves superior reconstruction quality on both simulated and experimental data, with remarkable robustness under challenging low-signal conditions. Furthermore, PtyINR offers a generalizable, physics-informed framework for addressing probe-dependent inverse problems, making it applicable to a wide range of computational microscopy problems.
Abstract:Fourier phase retrieval is essential for high-definition imaging of nanoscale structures across diverse fields, notably coherent diffraction imaging. This study presents the Single impliCit neurAl Network (SCAN), a tool built upon coordinate neural networks meticulously designed for enhanced phase retrieval performance. Bypassing the pitfalls of conventional iterative methods, which frequently face high computational loads and are prone to noise interference, SCAN adeptly connects object coordinates to their amplitude and phase within a unified network in an unsupervised manner. While many existing methods primarily use Fourier magnitude in their loss function, our approach incorporates both the predicted magnitude and phase, enhancing retrieval accuracy. Comprehensive tests validate SCAN's superiority over traditional and other deep learning models regarding accuracy and noise robustness. We also demonstrate that SCAN excels in the ptychography setting.