Chiplet-based systems, integrating various silicon dies manufactured at different integrated circuit technology nodes on a carrier interposer, have garnered significant attention in recent years due to their cost-effectiveness and competitive performance. The widespread adoption of reinforcement learning as a sequential placement method has introduced a new challenge in determining the optimal placement order for each chiplet. The order in which chiplets are placed on the interposer influences the spatial resources available for earlier and later placed chiplets, making the placement results highly sensitive to the sequence of chiplet placement. To address these challenges, we propose a learning to rank approach with graph representation, building upon the reinforcement learning framework RLPlanner. This method aims to select the optimal chiplet placement order for each chiplet-based system. Experimental results demonstrate that compared to placement order obtained solely based on the descending order of the chiplet area and the number of interconnect wires between the chiplets, utilizing the placement order obtained from the learning to rank network leads to further improvements in system temperature and inter-chiplet wirelength. Specifically, applying the top-ranked placement order obtained from the learning to rank network results in a 10.05% reduction in total inter-chiplet wirelength and a 1.01% improvement in peak system temperature during the chiplet placement process.
Chiplet-based systems have gained significant attention in recent years due to their low cost and competitive performance. As the complexity and compactness of a chiplet-based system increase, careful consideration must be given to microbump assignments, interconnect delays, and thermal limitations during the floorplanning stage. This paper introduces RLPlanner, an efficient early-stage floorplanning tool for chiplet-based systems with a novel fast thermal evaluation method. RLPlanner employs advanced reinforcement learning to jointly minimize total wirelength and temperature. To alleviate the time-consuming thermal calculations, RLPlanner incorporates the developed fast thermal evaluation method to expedite the iterations and optimizations. Comprehensive experiments demonstrate that our proposed fast thermal evaluation method achieves a mean absolute error (MAE) of 0.25 K and delivers over 120x speed-up compared to the open-source thermal solver HotSpot. When integrated with our fast thermal evaluation method, RLPlanner achieves an average improvement of 20.28\% in minimizing the target objective (a combination of wirelength and temperature), within a similar running time, compared to the classic simulated annealing method with HotSpot.