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Sampling Limits for Electron Tomography with Sparsity-exploiting Reconstructions

Apr 04, 2019
Yi Jiang, Elliot Padgett, Robert Hovden, David A. Muller

* Ultramicroscopy 186, 94-103 (2018) 

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Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing

Jan 23, 2019
Jonathan Schwartz, Yi Jiang, Yongjie Wang, Anthony Aiello, Pallab Bhattacharya, Hui Yuan, Zetian Mi, Nabil Bassim, Robert Hovden

* 15 pages, 5 figures 

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Data Processing For Atomic Resolution EELS

Dec 13, 2011
Paul Cueva, Robert Hovden, Julia A. Mundy, Huolin L. Xin, David A. Muller

* Microscopy and Microanalysis, Vol. 18 pp 667-675 (2012) 

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