Abstract:Machine Learning (ML) models for grain growth prediction are typically trained on idealized synthetic data, yet practical applications require generalization to conditions outside the training distribution. This study evaluated the Out-Of-Distribution (OOD) generalization capability of the trained model from our previous study across three test cases, including experimental microstructures, microstructures characterized by a bimodal grain size distribution, and abnormal grain growth. To further probe whether physics-informed architectural design could improve robustness under these different conditions, a boundary-masked attention mechanism was proposed specifically for grain growth, constraining attention to grain boundary pixels. Both the baseline and the proposed physics-informed attention model were evaluated without retraining or fine-tuning on the OOD data. Both models successfully generalized to all three test cases, yet the boundary-masked attention mechanism provided substantial improvements, with the most notable gains for microstructures characterized by a bimodal grain size distribution, where Structural Similarity Index Measure (SSIM) improved from \num{0.6221} to \num{0.7609} and mean grain size ($\overline{R}$) error decreased from \SI{8.75}{\percent} to \SI{3.57}{\percent}. The attention heatmap analysis revealed that the boundary-masked attention model learned to concentrate attention on large grain boundaries in a manner consistent with curvature-driven grain growth physics, emerging from training without being explicitly encoded into the architecture. These results indicate that models trained on synthetic data can generalize to diverse OOD conditions without retraining, and that physics-informed attention may improve accuracy when the boundary morphology matches the training domain.
Abstract:Grain Growth strongly influences the mechanical behavior of materials, making its prediction a key objective in microstructural engineering. In this study, several deep learning approaches were evaluated, including recurrent neural networks (RNN), long short-term memory (LSTM), temporal convolutional networks (TCN), and transformers, to forecast grain size distributions during grain growth. Unlike full-field simulations, which are computationally demanding, the present work relies on mean-field statistical descriptors extracted from high-fidelity simulations. A dataset of 120 grain growth sequences was processed into normalized grain size distributions as a function of time. The models were trained to predict future distributions from a short temporal history using a recursive forecasting strategy. Among the tested models, the LSTM network achieved the highest accuracy (above 90\%) and the most stable performance, maintaining physically consistent predictions over extended horizons while reducing computation time from about 20 minutes per sequence to only a few seconds, whereas the other architectures tended to diverge when forecasting further in time. These results highlight the potential of low-dimensional descriptors and LSTM-based forecasting for efficient and accurate microstructure prediction, with direct implications for digital twin development and process optimization.




Abstract:Grain growth simulation is crucial for predicting metallic material microstructure evolution during annealing and resulting final mechanical properties, but traditional partial differential equation-based methods are computationally expensive, creating bottlenecks in materials design and manufacturing. In this work, we introduce a machine learning framework that combines a Convolutional Long Short-Term Memory networks with an Autoencoder to efficiently predict grain growth evolution. Our approach captures both spatial and temporal aspects of grain evolution while encoding high-dimensional grain structure data into a compact latent space for pattern learning, enhanced by a novel composite loss function combining Mean Squared Error, Structural Similarity Index Measurement, and Boundary Preservation to maintain structural integrity of grain boundary topology of the prediction. Results demonstrated that our machine learning approach accelerates grain growth prediction by up to \SI{89}{\times} faster, reducing computation time from \SI{10}{\minute} to approximately \SI{10}{\second} while maintaining high-fidelity predictions. The best model (S-30-30) achieving a structural similarity score of \SI{86.71}{\percent} and mean grain size error of just \SI{0.07}{\percent}. All models accurately captured grain boundary topology, morphology, and size distributions. This approach enables rapid microstructural prediction for applications where conventional simulations are prohibitively time-consuming, potentially accelerating innovation in materials science and manufacturing.