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Jonas De Vylder

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Bayesian Deconvolution of Scanning Electron Microscopy Images Using Point-spread Function Estimation and Non-local Regularization

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Oct 23, 2018
Joris Roels, Jan Aelterman, Jonas De Vylder, Hiep Luong, Yvan Saeys, Wilfried Philips

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Convolutional Neural Network Pruning to Accelerate Membrane Segmentation in Electron Microscopy

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Oct 23, 2018
Joris Roels, Jonas De Vylder, Jan Aelterman, Yvan Saeys, Wilfried Philips

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