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Topologically Regularized Data Embeddings

Oct 18, 2021
Robin Vandaele, Bo Kang, Jefrey Lijffijt, Tijl De Bie, Yvan Saeys

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The Curse Revisited: a Newly Quantified Concept of Meaningful Distances for Learning from High-Dimensional Noisy Data

Sep 22, 2021
Robin Vandaele, Bo Kang, Tijl De Bie, Yvan Saeys

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Regional Image Perturbation Reduces $L_p$ Norms of Adversarial Examples While Maintaining Model-to-model Transferability

Jul 07, 2020
Utku Ozbulak, Jonathan Peck, Wesley De Neve, Bart Goossens, Yvan Saeys, Arnout Van Messem

* Accepted for the ICML 2020, Workshop on Uncertainty and Robustness in Deep Learning (UDL) 

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Cost-efficient segmentation of electron microscopy images using active learning

Nov 13, 2019
Joris Roels, Yvan Saeys

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Bayesian Deconvolution of Scanning Electron Microscopy Images Using Point-spread Function Estimation and Non-local Regularization

Oct 23, 2018
Joris Roels, Jan Aelterman, Jonas De Vylder, Hiep Luong, Yvan Saeys, Wilfried Philips

* 5 pages, 4 figures, EMBC 2016 

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Convolutional Neural Network Pruning to Accelerate Membrane Segmentation in Electron Microscopy

Oct 23, 2018
Joris Roels, Jonas De Vylder, Jan Aelterman, Yvan Saeys, Wilfried Philips

* 5 pages, 4 figures, ISBI 2017 

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Domain Adaptive Segmentation in Volume Electron Microscopy Imaging

Oct 23, 2018
Joris Roels, Julian Hennies, Yvan Saeys, Wilfried Philips, Anna Kreshuk

* 4 pages, 4 figures, ISBI 2019 (under review) 

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Interpretable Convolutional Neural Networks for Effective Translation Initiation Site Prediction

Nov 27, 2017
Jasper Zuallaert, Mijung Kim, Yvan Saeys, Wesley De Neve

* Presented at International Workshop on Deep Learning in Bioinformatics, Biomedicine, and Healthcare Informatics (DLB2H 2017) --- in conjunction with the IEEE International Conference on Bioinformatics and Biomedicine (BIBM 2017) 

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On the use of convolutional neural networks for robust classification of multiple fingerprint captures

May 15, 2017
Daniel Peralta, Isaac Triguero, Salvador García, Yvan Saeys, Jose M. Benitez, Francisco Herrera

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