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Yvan Saeys

Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE

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Jun 18, 2024
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GroupEnc: encoder with group loss for global structure preservation

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Sep 06, 2023
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Topologically Regularized Data Embeddings

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Jan 09, 2023
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Distilling Deep RL Models Into Interpretable Neuro-Fuzzy Systems

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Sep 07, 2022
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PDD-SHAP: Fast Approximations for Shapley Values using Functional Decomposition

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Aug 26, 2022
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Evaluating Feature Attribution Methods in the Image Domain

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Feb 22, 2022
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The Curse Revisited: a Newly Quantified Concept of Meaningful Distances for Learning from High-Dimensional Noisy Data

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Sep 22, 2021
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Regional Image Perturbation Reduces $L_p$ Norms of Adversarial Examples While Maintaining Model-to-model Transferability

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Jul 07, 2020
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Cost-efficient segmentation of electron microscopy images using active learning

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Nov 13, 2019
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