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Multi defect detection and analysis of electron microscopy images with deep learning

Aug 19, 2021
Mingren Shen, Guanzhao Li, Dongxia Wu, Yuhan Liu, Jacob Greaves, Wei Hao, Nathaniel J. Krakauer, Leah Krudy, Jacob Perez, Varun Sreenivasan, Bryan Sanchez, Oigimer Torres, Wei Li, Kevin Field, Dane Morgan

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