Abstract:Effective models of Cyber-Physical Systems (CPS) are crucial for their design and operation. Constructing such models is difficult and time-consuming due to the inherent complexity of CPS. As a result, data-driven model generation using machine learning methods is gaining popularity. In this paper, we present Flowcean, a novel framework designed to automate the generation of models through data-driven learning that focuses on modularity and usability. By offering various learning strategies, data processing methods, and evaluation metrics, our framework provides a comprehensive solution, tailored to CPS scenarios. Flowcean facilitates the integration of diverse learning libraries and tools within a modular and flexible architecture, ensuring adaptability to a wide range of modeling tasks. This streamlines the process of model generation and evaluation, making it more efficient and accessible.



Abstract:Cyber-Physical Systems (CPS) are complex systems that require powerful models for tasks like verification, diagnosis, or debugging. Often, suitable models are not available and manual extraction is difficult. Data-driven approaches then provide a solution to, e.g., diagnosis tasks and verification problems based on data collected from the system. In this paper, we consider CPS with a discrete abstraction in the form of a Mealy machine. We propose a data-driven approach to determine the safety probability of the system on a finite horizon of n time steps. The approach is based on the Probably Approximately Correct (PAC) learning paradigm. Thus, we elaborate a connection between discrete logic and probabilistic reachability analysis of systems, especially providing an additional confidence on the determined probability. The learning process follows an active learning paradigm, where new learning data is sampled in a guided way after an initial learning set is collected. We validate the approach with a case study on an automated lane-keeping system.




Abstract:Ageing detection and failure prediction are essential in many Internet of Things (IoT) deployments, which operate huge quantities of embedded devices unattended in the field for years. In this paper, we present a large-scale empirical analysis of natural SRAM wear-out using 154 boards from a general-purpose testbed. Starting from SRAM initialization bias, which each node can easily collect at startup, we apply various metrics for feature extraction and experiment with common machine learning methods to predict the age of operation for this node. Our findings indicate that even though ageing impacts are subtle, our indicators can well estimate usage times with an $R^2$ score of 0.77 and a mean error of 24% using regressors, and with an F1 score above 0.6 for classifiers applying a six-months resolution.