SAMSEM -- A Generic and Scalable Approach for IC Metal Line Segmentation

In light of globalized hardware supply chains, the assurance of hardware components has gained significant interest, particularly in cryptographic applications and high-stakes scenarios. Identifying metal lines on scanning electron microscope (SEM) images of integrated circuits (ICs) is one essential step in verifying the absence of malicious circuitry in chips manufactured in untrusted environments. Due to varying manufacturing processes and technologies, such verification usually requires tuning parameters and algorithms for each target IC. Often, a machine learning model trained on images of one IC fails to accurately detect metal lines on other ICs. To address this challenge, we create SAMSEM by adapting Meta's Segment Anything Model 2 (SAM2) to the domain of IC metal line segmentation. Specifically, we develop a multi-scale segmentation approach that can handle SEM images of varying sizes, resolutions, and magnifications. Furthermore, we deploy a topology-based loss alongside pixel-based losses to focus our segmentation on electrical connectivity rather than pixel-level accuracy. Based on a hyperparameter optimization, we then fine-tune the SAM2 model to obtain a model that generalizes across different technology nodes, manufacturing materials, sample preparation methods, and SEM imaging technologies. To this end, we leverage an unprecedented dataset of SEM images obtained from 48 metal layers across 14 different ICs. When fine-tuned on seven ICs, SAMSEM achieves an error rate as low as 0.72% when evaluated on other images from the same ICs. For the remaining seven unseen ICs, it still achieves error rates as low as 5.53%. Finally, when fine-tuned on all 14 ICs, we observe an error rate of 0.62%. Hence, SAMSEM proves to be a reliable tool that significantly advances the frontier in metal line segmentation, a key challenge in post-manufacturing IC verification.

Attacks Against Mobility Prediction in 5G Networks

The $5^{th}$ generation of mobile networks introduces a new Network Function (NF) that was not present in previous generations, namely the Network Data Analytics Function (NWDAF). Its primary objective is to provide advanced analytics services to various entities within the network and also towards external application services in the 5G ecosystem. One of the key use cases of NWDAF is mobility trajectory prediction, which aims to accurately support efficient mobility management of User Equipment (UE) in the network by allocating ``just in time'' necessary network resources. In this paper, we show that there are potential mobility attacks that can compromise the accuracy of these predictions. In a semi-realistic scenario with 10,000 subscribers, we demonstrate that an adversary equipped with the ability to hijack cellular mobile devices and clone them can significantly reduce the prediction accuracy from 75\% to 40\% using just 100 adversarial UEs. While a defense mechanism largely depends on the attack and the mobility types in a particular area, we prove that a basic KMeans clustering is effective in distinguishing legitimate and adversarial UEs.