Alert button

ODIM: an efficient method to detect outliers via inlier-memorization effect of deep generative models

Add code
Bookmark button
Alert button
Jan 11, 2023
Dongha Kim, Jaesung Hwang, Jongjin Lee, Kunwoong Kim, Yongdai Kim

Figure 1 for ODIM: an efficient method to detect outliers via inlier-memorization effect of deep generative models
Figure 2 for ODIM: an efficient method to detect outliers via inlier-memorization effect of deep generative models
Figure 3 for ODIM: an efficient method to detect outliers via inlier-memorization effect of deep generative models
Figure 4 for ODIM: an efficient method to detect outliers via inlier-memorization effect of deep generative models

Share this with someone who'll enjoy it:

View paper onarxiv icon

Share this with someone who'll enjoy it: