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Deep Metric Learning for Few-Shot Image Classification: A Selective Review

May 17, 2021
Xiaoxu Li, Xiaochen Yang, Zhanyu Ma, Jing-Hao Xue


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Few-shot image classification is a challenging problem which aims to achieve the human level of recognition based only on a small number of images. Deep learning algorithms such as meta-learning, transfer learning, and metric learning have been employed recently and achieved the state-of-the-art performance. In this survey, we review representative deep metric learning methods for few-shot classification, and categorize them into three groups according to the major problems and novelties they focus on. We conclude this review with a discussion on current challenges and future trends in few-shot image classification.



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