Alert button
Picture for Stefano Laureti

Stefano Laureti

Alert button

Pseudo-noise pulse-compression thermography: a powerful tool for time-domain thermography analysis

Add code
Bookmark button
Alert button
May 01, 2024
Marco Ricci, Rocco Zito, Stefano Laureti

Viaarxiv icon

Capacitive imaging using fused amplitude and phase information for improved defect detection

Add code
Bookmark button
Alert button
Mar 25, 2021
Silvio Amato, David Hutchins, Xiaokang Yin, Marco Ricci, Stefano Laureti

Figure 1 for Capacitive imaging using fused amplitude and phase information for improved defect detection
Figure 2 for Capacitive imaging using fused amplitude and phase information for improved defect detection
Figure 3 for Capacitive imaging using fused amplitude and phase information for improved defect detection
Figure 4 for Capacitive imaging using fused amplitude and phase information for improved defect detection
Viaarxiv icon

Quantitative Evaluation of Crack Depths on Thin Aluminum Plate using Eddy Current Pulse-Compression Thermography

Add code
Bookmark button
Alert button
Feb 24, 2021
Qiuji Yi, Hamed Malekmohammadi, Gui Yun Tian, Stefano Laureti, Marco Ricci

Figure 1 for Quantitative Evaluation of Crack Depths on Thin Aluminum Plate using Eddy Current Pulse-Compression Thermography
Figure 2 for Quantitative Evaluation of Crack Depths on Thin Aluminum Plate using Eddy Current Pulse-Compression Thermography
Figure 3 for Quantitative Evaluation of Crack Depths on Thin Aluminum Plate using Eddy Current Pulse-Compression Thermography
Figure 4 for Quantitative Evaluation of Crack Depths on Thin Aluminum Plate using Eddy Current Pulse-Compression Thermography
Viaarxiv icon

A low-cost flexible instrument made of off-the-shelf components for pulsed eddy current testing: overview and application to pseudo-noise excitation

Add code
Bookmark button
Alert button
Feb 23, 2021
Hamed Malekmohammadi, Andrea Migali, Stefano Laureti, Marco Ricci

Figure 1 for A low-cost flexible instrument made of off-the-shelf components for pulsed eddy current testing: overview and application to pseudo-noise excitation
Figure 2 for A low-cost flexible instrument made of off-the-shelf components for pulsed eddy current testing: overview and application to pseudo-noise excitation
Figure 3 for A low-cost flexible instrument made of off-the-shelf components for pulsed eddy current testing: overview and application to pseudo-noise excitation
Figure 4 for A low-cost flexible instrument made of off-the-shelf components for pulsed eddy current testing: overview and application to pseudo-noise excitation
Viaarxiv icon