Experts in the Loop: Conditional Variable Selection for Accelerating Post-Silicon Analysis Based on Deep Learning

Post-silicon validation is one of the most critical processes in modern semiconductor manufacturing. Specifically, correct and deep understanding in test cases of manufactured devices is key to enable post-silicon tuning and debugging. This analysis is typically performed by experienced human experts. However, with the fast development in semiconductor industry, test cases can contain hundreds of variables. The resulting high-dimensionality poses enormous challenges to experts. Thereby, some recent prior works have introduced data-driven variable selection algorithms to tackle these problems and achieved notable success. Nevertheless, for these methods, experts are not involved in training and inference phases, which may lead to bias and inaccuracy due to the lack of prior knowledge. Hence, this work for the first time aims to design a novel conditional variable selection approach while keeping experts in the loop. In this way, we expect that our algorithm can be more efficiently and effectively trained to identify the most critical variables under certain expert knowledge. Extensive experiments on both synthetic and real-world datasets from industry have been conducted and shown the effectiveness of our method.

Deep Feature Selection Using a Novel Complementary Feature Mask

Feature selection has drawn much attention over the last decades in machine learning because it can reduce data dimensionality while maintaining the original physical meaning of features, which enables better interpretability than feature extraction. However, most existing feature selection approaches, especially deep-learning-based, often focus on the features with great importance scores only but neglect those with less importance scores during training as well as the order of important candidate features. This can be risky since some important and relevant features might be unfortunately ignored during training, leading to suboptimal solutions or misleading selections. In our work, we deal with feature selection by exploiting the features with less importance scores and propose a feature selection framework based on a novel complementary feature mask. Our method is generic and can be easily integrated into existing deep-learning-based feature selection approaches to improve their performance as well. Experiments have been conducted on benchmarking datasets and shown that the proposed method can select more representative and informative features than the state of the art.

A Deep-Learning-Aided Pipeline for Efficient Post-Silicon Tuning

In post-silicon validation, tuning is to find the values for the tuning knobs, potentially as a function of process parameters and/or known operating conditions. In this sense, an more efficient tuning requires identifying the most critical tuning knobs and process parameters in terms of a given figure-of-merit for a Device Under Test (DUT). This is often manually conducted by experienced experts. However, with increasingly complex chips, manual inspection on a large amount of raw variables has become more challenging. In this work, we leverage neural networks to efficiently select the most relevant variables and present a corresponding deep-learning-aided pipeline for efficient tuning.

Conditional Variable Selection for Intelligent Test

Intelligent test requires efficient and effective analysis of high-dimensional data in a large scale. Traditionally, the analysis is often conducted by human experts, but it is not scalable in the era of big data. To tackle this challenge, variable selection has been recently introduced to intelligent test. However, in practice, we encounter scenarios where certain variables (e.g. some specific processing conditions for a device under test) must be maintained after variable selection. We call this conditional variable selection, which has not been well investigated for embedded or deep-learning-based variable selection methods. In this paper, we discuss a novel conditional variable selection framework that can select the most important candidate variables given a set of preselected variables.

Self-Learning Tuning for Post-Silicon Validation

Increasing complexity of modern chips makes design validation more difficult. Existing approaches are not able anymore to cope with the complexity of tasks such as robust performance tuning in post-silicon validation. Therefore, we propose a novel approach based on learn-to-optimize and reinforcement learning in order to solve complex and mixed-type tuning tasks in a efficient and robust way.

ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems\

In recent years, the usage of ensemble learning in applications has grown significantly due to increasing computational power allowing the training of large ensembles in reasonable time frames. Many applications, e.g., malware detection, face recognition, or financial decision-making, use a finite set of learning algorithms and do aggregate them in a way that a better predictive performance is obtained than any other of the individual learning algorithms. In the field of Post-Silicon Validation for semiconductor devices (PSV), data sets are typically provided that consist of various devices like, e.g., chips of different manufacturing lines. In PSV, the task is to approximate the underlying function of the data with multiple learning algorithms, each trained on a device-specific subset, instead of improving the performance of arbitrary classifiers on the entire data set. Furthermore, the expectation is that an unknown number of subsets describe functions showing very different characteristics. Corresponding ensemble members, which are called outliers, can heavily influence the approximation. Our method aims to find a suitable approximation that is robust to outliers and represents the best or worst case in a way that will apply to as many types as possible. A 'soft-max' or 'soft-min' function is used in place of a maximum or minimum operator. A Neural Network (NN) is trained to learn this 'soft-function' in a two-stage process. First, we select a subset of ensemble members that is representative of the best or worst case. Second, we combine these members and define a weighting that uses the properties of the Local Outlier Factor (LOF) to increase the influence of non-outliers and to decrease outliers. The weighting ensures robustness to outliers and makes sure that approximations are suitable for most types.

Feature Selection Using Batch-Wise Attenuation and Feature Mask Normalization

Feature selection is generally used as one of the most important pre-processing techniques in machine learning, as it helps to reduce the dimensionality of data and assists researchers and practitioners in understanding data. Thereby, better performance and reduced computational consumption, memory complexity and even data amount can be expected by utilizing feature selection. However, only few studies leverage the power of deep neural networks to solve the problem of feature selection. In this paper, we propose a feature mask module (FM-module) for feature selection based on a novel batch-wise attenuation and feature mask normalization. The proposed method is almost free from hyperparameters and can be easily integrated into common neural networks as an embedded feature selection method. Experiments on popular image, text and speech datasets have been shown that our approach is easy to use and has superior performance in comparison with other state-of-the-art deep learning based feature selection methods.