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Robust Machine Learning Systems: Challenges, Current Trends, Perspectives, and the Road Ahead


Jan 04, 2021
Muhammad Shafique, Mahum Naseer, Theocharis Theocharides, Christos Kyrkou, Onur Mutlu, Lois Orosa, Jungwook Choi

* IEEE Design and Test (Volume: 37, Issue: 2, April 2020): 30-57 
* Final version appears in https://ieeexplore.ieee.org/document/8979377 

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FANNet: Formal Analysis of Noise Tolerance, Training Bias and Input Sensitivity in Neural Networks


Dec 03, 2019
Mahum Naseer, Mishal Fatima Minhas, Faiq Khalid, Muhammad Abdullah Hanif, Osman Hasan, Muhammad Shafique

* To appear at the 23rd Design, Automation and Test in Europe (DATE 2020). Grenoble, France 

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