Learning with Positive and Imperfect Unlabeled Data

We study the problem of learning binary classifiers from positive and unlabeled data when the unlabeled data distribution is shifted, which we call Positive and Imperfect Unlabeled (PIU) Learning. In the absence of covariate shifts, i.e., with perfect unlabeled data, Denis (1998) reduced this problem to learning under Massart noise; however, that reduction fails under even slight shifts. Our main results on PIU learning are the characterizations of the sample complexity of PIU learning and a computationally and sample-efficient algorithm achieving a misclassification error $\varepsilon$. We further show that our results lead to new algorithms for several related problems. 1. Learning from smooth distributions: We give algorithms that learn interesting concept classes from only positive samples under smooth feature distributions, bypassing known existing impossibility results and contributing to recent advances in smoothened learning (Haghtalab et al, J.ACM'24) (Chandrasekaran et al., COLT'24). 2. Learning with a list of unlabeled distributions: We design new algorithms that apply to a broad class of concept classes under the assumption that we are given a list of unlabeled distributions, one of which--unknown to the learner--is $O(1)$-close to the true feature distribution. 3. Estimation in the presence of unknown truncation: We give the first polynomial sample and time algorithm for estimating the parameters of an exponential family distribution from samples truncated to an unknown set approximable by polynomials in $L_1$-norm. This improves the algorithm by Lee et al. (FOCS'24) that requires approximation in $L_2$-norm. 4. Detecting truncation: We present new algorithms for detecting whether given samples have been truncated (or not) for a broad class of non-product distributions, including non-product distributions, improving the algorithm by De et al. (STOC'24).

Efficient Statistics With Unknown Truncation, Polynomial Time Algorithms, Beyond Gaussians

We study the estimation of distributional parameters when samples are shown only if they fall in some unknown set $S \subseteq \mathbb{R}^d$. Kontonis, Tzamos, and Zampetakis (FOCS'19) gave a $d^{\mathrm{poly}(1/\varepsilon)}$ time algorithm for finding $\varepsilon$-accurate parameters for the special case of Gaussian distributions with diagonal covariance matrix. Recently, Diakonikolas, Kane, Pittas, and Zarifis (COLT'24) showed that this exponential dependence on $1/\varepsilon$ is necessary even when $S$ belongs to some well-behaved classes. These works leave the following open problems which we address in this work: Can we estimate the parameters of any Gaussian or even extend beyond Gaussians? Can we design $\mathrm{poly}(d/\varepsilon)$ time algorithms when $S$ is a simple set such as a halfspace? We make progress on both of these questions by providing the following results: 1. Toward the first question, we give a $d^{\mathrm{poly}(\ell/\varepsilon)}$ time algorithm for any exponential family that satisfies some structural assumptions and any unknown set $S$ that is $\varepsilon$-approximable by degree-$\ell$ polynomials. This result has two important applications: 1a) The first algorithm for estimating arbitrary Gaussian distributions from samples truncated to an unknown $S$; and 1b) The first algorithm for linear regression with unknown truncation and Gaussian features. 2. To address the second question, we provide an algorithm with runtime $\mathrm{poly}(d/\varepsilon)$ that works for a set of exponential families (containing all Gaussians) when $S$ is a halfspace or an axis-aligned rectangle. Along the way, we develop tools that may be of independent interest, including, a reduction from PAC learning with positive and unlabeled samples to PAC learning with positive and negative samples that is robust to certain covariate shifts.