CROP: Circuit Retrieval and Optimization with Parameter Guidance using LLMs

Modern very large-scale integration (VLSI) design requires the implementation of integrated circuits using electronic design automation (EDA) tools. Due to the complexity of EDA algorithms, the vast parameter space poses a huge challenge to chip design optimization, as the combination of even moderate numbers of parameters creates an enormous solution space to explore. Manual parameter selection remains industrial practice despite being excessively laborious and limited by expert experience. To address this issue, we present CROP, the first large language model (LLM)-powered automatic VLSI design flow tuning framework. Our approach includes: (1) a scalable methodology for transforming RTL source code into dense vector representations, (2) an embedding-based retrieval system for matching designs with semantically similar circuits, and (3) a retrieval-augmented generation (RAG)-enhanced LLM-guided parameter search system that constrains the search process with prior knowledge from similar designs. Experiment results demonstrate CROP's ability to achieve superior quality-of-results (QoR) with fewer iterations than existing approaches on industrial designs, including a 9.9% reduction in power consumption.

A Survey of Research in Large Language Models for Electronic Design Automation

Within the rapidly evolving domain of Electronic Design Automation (EDA), Large Language Models (LLMs) have emerged as transformative technologies, offering unprecedented capabilities for optimizing and automating various aspects of electronic design. This survey provides a comprehensive exploration of LLM applications in EDA, focusing on advancements in model architectures, the implications of varying model sizes, and innovative customization techniques that enable tailored analytical insights. By examining the intersection of LLM capabilities and EDA requirements, the paper highlights the significant impact these models have on extracting nuanced understandings from complex datasets. Furthermore, it addresses the challenges and opportunities in integrating LLMs into EDA workflows, paving the way for future research and application in this dynamic field. Through this detailed analysis, the survey aims to offer valuable insights to professionals in the EDA industry, AI researchers, and anyone interested in the convergence of advanced AI technologies and electronic design.