Image Segmentation using U-Net Architecture for Powder X-ray Diffraction Images

Scientific researchers frequently use the in situ synchrotron high-energy powder X-ray diffraction (XRD) technique to examine the crystallographic structures of materials in functional devices such as rechargeable battery materials. We propose a method for identifying artifacts in experimental XRD images. The proposed method uses deep learning convolutional neural network architectures, such as tunable U-Nets to identify the artifacts. In particular, the predicted artifacts are evaluated against the corresponding ground truth (manually implemented) using the overall true positive rate or recall. The result demonstrates that the U-Nets can consistently produce great recall performance at 92.4% on the test dataset, which is not included in the training, with a 34% reduction in average false positives in comparison to the conventional method. The U-Nets also reduce the time required to identify and separate artifacts by more than 50%. Furthermore, the exclusion of the artifacts shows major changes in the integrated 1D XRD pattern, enhancing further analysis of the post-processing XRD data.

MLExchange: A web-based platform enabling exchangeable machine learning workflows

Machine learning (ML) algorithms are showing a growing trend in helping the scientific communities across different disciplines and institutions to address large and diverse data problems. However, many available ML tools are programmatically demanding and computationally costly. The MLExchange project aims to build a collaborative platform equipped with enabling tools that allow scientists and facility users who do not have a profound ML background to use ML and computational resources in scientific discovery. At the high level, we are targeting a full user experience where managing and exchanging ML algorithms, workflows, and data are readily available through web applications. So far, we have built four major components, i.e, the central job manager, the centralized content registry, user portal, and search engine, and successfully deployed these components on a testing server. Since each component is an independent container, the whole platform or its individual service(s) can be easily deployed at servers of different scales, ranging from a laptop (usually a single user) to high performance clusters (HPC) accessed (simultaneously) by many users. Thus, MLExchange renders flexible using scenarios -- users could either access the services and resources from a remote server or run the whole platform or its individual service(s) within their local network.

Artifact Identification in X-ray Diffraction Data using Machine Learning Methods

The in situ synchrotron high-energy X-ray powder diffraction (XRD) technique is highly utilized by researchers to analyze the crystallographic structures of materials in functional devices (e.g., battery materials) or in complex sample environments (e.g., diamond anvil cells or syntheses reactors). An atomic structure of a material can be identified by its diffraction pattern, along with detailed analysis such as Rietveld refinement which indicates how the measured structure deviates from the ideal structure (e.g., internal stresses or defects). For in situ experiments, a series of XRD images is usually collected on the same sample at different conditions (e.g., adiabatic conditions), yielding different states of matter, or simply collected continuously as a function of time to track the change of a sample over a chemical or physical process. In situ experiments are usually performed with area detectors, collecting 2D images composed of diffraction rings for ideal powders. Depending on the material's form, one may observe different characteristics other than the typical Debye Scherrer rings for a realistic sample and its environments, such as textures or preferred orientations and single crystal diffraction spots in the 2D XRD image. In this work, we present an investigation of machine learning methods for fast and reliable identification and separation of the single crystal diffraction spots in XRD images. The exclusion of artifacts during an XRD image integration process allows a precise analysis of the powder diffraction rings of interest. We observe that the gradient boosting method can consistently produce high accuracy results when it is trained with small subsets of highly diverse datasets. The method dramatically decreases the amount of time spent on identifying and separating single crystal spots in comparison to the conventional method.