Abstract:The design of Analog and Mixed-Signal (AMS) integrated circuits (ICs) often involves significant manual effort, especially during the transistor sizing process. While Machine Learning techniques in Electronic Design Automation (EDA) have shown promise in reducing complexity and minimizing human intervention, they still face challenges such as numerous iterations and a lack of knowledge about AMS circuit design. Recently, Large Language Models (LLMs) have demonstrated significant potential across various fields, showing a certain level of knowledge in circuit design and indicating their potential to automate the transistor sizing process. In this work, we propose an LLM-based AI agent for AMS circuit design to assist in the sizing process. By integrating LLMs with external circuit simulation tools and data analysis functions and employing prompt engineering strategies, the agent successfully optimized multiple circuits to achieve target performance metrics. We evaluated the performance of different LLMs to assess their applicability and optimization effectiveness across seven basic circuits, and selected the best-performing model Claude 3.5 Sonnet for further exploration on an operational amplifier, with complementary input stage and class AB output stage. This circuit was evaluated against nine performance metrics, and we conducted experiments under three distinct performance requirement groups. A success rate of up to 60% was achieved for reaching the target requirements. Overall, this work demonstrates the potential of LLMs to improve AMS circuit design.
Abstract:The Test and Measurement domain, known for its strict requirements for accuracy and efficiency, is increasingly adopting Generative AI technologies to enhance the performance of data analysis, automation, and decision-making processes. Among these, Large Language Models (LLMs) show significant promise for advancing automation and precision in testing. However, the evaluation of LLMs in this specialized area remains insufficiently explored. To address this gap, we introduce the Test and Measurement Intelligence Quotient (TMIQ), a benchmark designed to quantitatively assess LLMs across a wide range of electronic engineering tasks. TMIQ offers a comprehensive set of scenarios and metrics for detailed evaluation, including SCPI command matching accuracy, ranked response evaluation, Chain-of-Thought Reasoning (CoT), and the impact of output formatting variations required by LLMs on performance. In testing various LLMs, our findings indicate varying levels of proficiency, with exact SCPI command match accuracy ranging from around 56% to 73%, and ranked matching first-position scores achieving around 33% for the best-performing model. We also assess token usage, cost-efficiency, and response times, identifying trade-offs between accuracy and operational efficiency. Additionally, we present a command-line interface (CLI) tool that enables users to generate datasets using the same methodology, allowing for tailored assessments of LLMs. TMIQ and the CLI tool provide a rigorous, reproducible means of evaluating LLMs for production environments, facilitating continuous monitoring and identifying strengths and areas for improvement, and driving innovation in their selections for applications within the Test and Measurement industry.