VeriBug: An Attention-based Framework for Bug-Localization in Hardware Designs

In recent years, there has been an exponential growth in the size and complexity of System-on-Chip designs targeting different specialized applications. The cost of an undetected bug in these systems is much higher than in traditional processor systems as it may imply the loss of property or life. The problem is further exacerbated by the ever-shrinking time-to-market and ever-increasing demand to churn out billions of devices. Despite decades of research in simulation and formal methods for debugging and verification, it is still one of the most time-consuming and resource intensive processes in contemporary hardware design cycle. In this work, we propose VeriBug, which leverages recent advances in deep learning to accelerate debugging at the Register-Transfer Level and generates explanations of likely root causes. First, VeriBug uses control-data flow graph of a hardware design and learns to execute design statements by analyzing the context of operands and their assignments. Then, it assigns an importance score to each operand in a design statement and uses that score for generating explanations for failures. Finally, VeriBug produces a heatmap highlighting potential buggy source code portions. Our experiments show that VeriBug can achieve an average bug localization coverage of 82.5% on open-source designs and different types of injected bugs.

Feature Engineering for Scalable Application-Level Post-Silicon Debugging

We present systematic and efficient solutions for both observability enhancement and root-cause diagnosis of post-silicon System-on-Chips (SoCs) validation with diverse usage scenarios. We model specification of interacting flows in typical applications for message selection. Our method for message selection optimizes flow specification coverage and trace buffer utilization. We define the diagnosis problem as identifying buggy traces as outliers and bug-free traces as inliers/normal behaviors, for which we use unsupervised learning algorithms for outlier detection. Instead of direct application of machine learning algorithms over trace data using the signals as raw features, we use feature engineering to transform raw features into more sophisticated features using domain specific operations. The engineered features are highly relevant to the diagnosis task and are generic to be applied across any hardware designs. We present debugging and root cause analysis of subtle post-silicon bugs in industry-scale OpenSPARC T2 SoC. We achieve a trace buffer utilization of 98.96\% with a flow specification coverage of 94.3\% (average). Our diagnosis method was able to diagnose up to 66.7\% more bugs and took up to 847$\times$ less diagnosis time as compared to the manual debugging with a diagnosis precision of 0.769.