Abstract:We consider the following statistical estimation problem: given a family F of real valued functions over some domain X and an i.i.d. sample drawn from an unknown distribution P over X, find h in F such that the expectation of h w.r.t. P is probably approximately equal to the supremum over expectations on members of F. This Expectation Maximization (EMX) problem captures many well studied learning problems; in fact, it is equivalent to Vapnik's general setting of learning. Surprisingly, we show that the EMX learnability, as well as the learning rates of some basic class F, depend on the cardinality of the continuum and is therefore independent of the set theory ZFC axioms (that are widely accepted as a formalization of the notion of a mathematical proof). We focus on the case where the functions in F are Boolean, which generalizes classification problems. We study the interaction between the statistical sample complexity of F and its combinatorial structure. We introduce a new version of sample compression schemes and show that it characterizes EMX learnability for a wide family of classes. However, we show that for the class of finite subsets of the real line, the existence of such compression schemes is independent of set theory. We conclude that the learnability of that class with respect to the family of probability distributions of countable support is independent of the set theory ZFC axioms. We also explore the existence of a "VC-dimension-like" parameter that captures learnability in this setting. Our results imply that that there exist no "finitary" combinatorial parameter that characterizes EMX learnability in a way similar to the VC-dimension based characterization of binary valued classification problems.
Abstract:In this work we study the quantitative relation between VC-dimension and two other basic parameters related to learning and teaching. Namely, the quality of sample compression schemes and of teaching sets for classes of low VC-dimension. Let $C$ be a binary concept class of size $m$ and VC-dimension $d$. Prior to this work, the best known upper bounds for both parameters were $\log(m)$, while the best lower bounds are linear in $d$. We present significantly better upper bounds on both as follows. Set $k = O(d 2^d \log \log |C|)$. We show that there always exists a concept $c$ in $C$ with a teaching set (i.e. a list of $c$-labeled examples uniquely identifying $c$ in $C$) of size $k$. This problem was studied by Kuhlmann (1999). Our construction implies that the recursive teaching (RT) dimension of $C$ is at most $k$ as well. The RT-dimension was suggested by Zilles et al. and Doliwa et al. (2010). The same notion (under the name partial-ID width) was independently studied by Wigderson and Yehudayoff (2013). An upper bound on this parameter that depends only on $d$ is known just for the very simple case $d=1$, and is open even for $d=2$. We also make small progress towards this seemingly modest goal. We further construct sample compression schemes of size $k$ for $C$, with additional information of $k \log(k)$ bits. Roughly speaking, given any list of $C$-labelled examples of arbitrary length, we can retain only $k$ labeled examples in a way that allows to recover the labels of all others examples in the list, using additional $k\log (k)$ information bits. This problem was first suggested by Littlestone and Warmuth (1986).