Double-descent refers to the unexpected drop in test loss of a learning algorithm beyond an interpolating threshold with over-parameterization, which is not predicted by information criteria in their classical forms due to the limitations in the standard asymptotic approach. We update these analyses using the information risk minimization framework and provide Akaike Information Criterion (AIC) and Bayesian Information Criterion (BIC) for models learned by stochastic gradient Langevin dynamics (SGLD). Notably, the AIC and BIC penalty terms for SGLD correspond to specific information measures, i.e., symmetrized KL information and KL divergence. We extend this information-theoretic analysis to over-parameterized models by characterizing the SGLD-based BIC for the random feature model in the regime where the number of parameters $p$ and the number of samples $n$ tend to infinity, with $p/n$ fixed. Our experiments demonstrate that the refined SGLD-based BIC can track the double-descent curve, providing meaningful guidance for model selection and revealing new insights into the behavior of SGLD learning algorithms in the over-parameterized regime.