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A tomographic workflow to enable deep learning for X-ray based foreign object detection

Jan 28, 2022
Mathé T. Zeegers, Tristan van Leeuwen, Daniël M. Pelt, Sophia Bethany Coban, Robert van Liere, Kees Joost Batenburg

Figure 1 for A tomographic workflow to enable deep learning for X-ray based foreign object detection
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Figure 4 for A tomographic workflow to enable deep learning for X-ray based foreign object detection

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