Accurate characterization of the inner surface of X-ray monocapillary optics (XMCO) is of great significance in X-ray optics research. Compared with other characterization methods, the micro computed tomography (micro-CT) method has its unique advantages but also has some disadvantages, such as a long scanning time, long image reconstruction time, and inconvenient scanning process. In this paper, sparse sampling was proposed to shorten the scanning time, GPU acceleration technology was used to improve the speed of image reconstruction, and a simple geometric calibration algorithm was proposed to avoid the calibration phantom and simplify the scanning process. These methodologies will popularize the use of the micro-CT method in XMCO characterization.