Symmetric-Reciprocal-Match Method for Vector Network Analyzer Calibration

This paper proposes a new approach, the symmetric-reciprocal-match (SRM) method, for calibrating vector network analyzers (VNAs). The method involves using multiple symmetric one-port loads, a two-port reciprocal device, and a matched load. The load standards consist of two-port symmetric one-port devices, and at least three unique loads are used. However, the specific impedances of the loads are not specified. The reciprocal device can be any transmissive device, although a non-reciprocal device can also be used if only the one-port error boxes are of interest. The matched load is fully defined and can be asymmetric. We numerically demonstrated the proposed method's accuracy with synthetic data and with measurements of coaxial standards using a commercial short-open-load-reciprocal (SOLR) calibration kit with verification standards. An advantage of the proposed method is that only the match standard is defined, whereas the remaining standards are partially defined, either through symmetry or reciprocity.

A Thru-free Multiline Calibration

This paper proposes a modification to the traditional multiline thru-reflect-line (TRL) or line-reflect-line (LRL) calibration method used for vector network analyzers (VNAs). Our proposed method eliminates the need for a thru (or line) standard by using an arbitrary transmissive two-port device in combination with an additional reflect standard. This combination of standards allows us to arbitrarily set the location of the calibration plane using physical artifacts. In contrast to the standard multiline TRL method, the suggested approach avoids a post-processing step to shift the calibration plane if a line standard is used. We demonstrate our proposed method with measurements on a printed circuit board (PCB) and compare it to the multiline TRL method with a perfectly defined thru.

Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration

This study proposes a linear approach for propagating uncertainties in the multiline thru-reflect-line (TRL) calibration method for vector network analyzers. The multiline TRL formulation we are proposing applies the law of uncertainty propagation as outlined in the ISO Guide to the Expression of Uncertainty in Measurement (GUM) to both measurement and model uncertainties. In addition, we conducted a Monte Carlo analysis using a combination of measured and synthetic data to model various uncertainties, such as additive noise, reflect asymmetry, line mismatch, and line length offset. The results of our linear uncertainty formulation demonstrate agreement with the Monte Carlo method and provide a more efficient means of assessing the uncertainty budget of the multiline TRL calibration.

An Impedance Transition Method to Verify the Reference Impedance of Multiline TRL Calibration

In this paper, we present a new technique for assessing the validity of the reference impedance in multiline thru-reflect-line (mTRL) calibration. When performing an mTRL calibration, it is assumed that all transmission line standards exhibit the same characteristic impedance. As a result, the reference impedance after calibration is set to the characteristic impedance of the transmission line standards used in the calibration. However, because of imperfections, these assumptions are prone to errors. The purpose of this paper is to assess the validity of the reference impedance after an mTRL calibration. The method we propose uses the reflection coefficient of an impedance transition segment as a verification metric. The verification is achieved by performing two mTRL calibrations. The first mTRL calibration is the one we desire to validate, while the second mTRL calibration is based on step impedance lines that create the impedance transition. We conclude that the mTRL calibration is valid if the resulting reflection coefficient falls within the expected 95% confidence interval. We demonstrate our proposed method with printed circuit board (PCB) measurements of microstrip lines up to 150 GHz. The advantage of our approach is that the reflection coefficient of an impedance transition is almost constant with respect to frequency for many types of transmission line, which makes this validation metric easy to interpret when errors are present.

Propagation of Measurement and Model Uncertainties through Multiline TRL Calibration

In this work, we present a linear uncertainty (LU) propagation treatment of measurement and model uncertainties in multiline thru-reflect-line (TRL) calibration. The proposed method is in accordance with the ISO Guide to the Expression of Uncertainty in Measurement (GUM). We demonstrate with numerical simulation based on the Monte Carlo (MC) method that our proposed LU method delivers identical uncertainty as the MC method but in a more efficient way.