Alert button
Picture for Vladyslav Andriiashen

Vladyslav Andriiashen

Alert button

X-ray Image Generation as a Method of Performance Prediction for Real-Time Inspection: a Case Study

Add code
Bookmark button
Alert button
Jan 30, 2024
Vladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen, K. Joost Batenburg

Viaarxiv icon

Quantifying the effect of X-ray scattering for data generation in real-time defect detection

Add code
Bookmark button
Alert button
May 22, 2023
Vladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen, K. Joost Batenburg

Figure 1 for Quantifying the effect of X-ray scattering for data generation in real-time defect detection
Figure 2 for Quantifying the effect of X-ray scattering for data generation in real-time defect detection
Figure 3 for Quantifying the effect of X-ray scattering for data generation in real-time defect detection
Figure 4 for Quantifying the effect of X-ray scattering for data generation in real-time defect detection
Viaarxiv icon

Unsupervised foreign object detection based on dual-energy absorptiometry in the food industry

Add code
Bookmark button
Alert button
Apr 12, 2021
Vladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen, Kees Joost Batenburg

Figure 1 for Unsupervised foreign object detection based on dual-energy absorptiometry in the food industry
Figure 2 for Unsupervised foreign object detection based on dual-energy absorptiometry in the food industry
Figure 3 for Unsupervised foreign object detection based on dual-energy absorptiometry in the food industry
Figure 4 for Unsupervised foreign object detection based on dual-energy absorptiometry in the food industry
Viaarxiv icon

Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning

Add code
Bookmark button
Alert button
Dec 24, 2020
Sophia Bethany Coban, Vladyslav Andriiashen, Poulami Somanya Ganguly, Maureen van Eijnatten, Kees Joost Batenburg

Figure 1 for Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning
Figure 2 for Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning
Figure 3 for Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning
Figure 4 for Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning
Viaarxiv icon