Abstract:Quantum metrology is a promising application of quantum technologies, enabling the precise measurement of weak external fields at a local scale. In typical quantum sensing protocols, a qubit interacts with an external field, and the amplitude of the field is estimated by analyzing the expectation value of a measured observable. Sensitivity can, in principle, be enhanced by increasing the number of qubits within a fixed volume, thereby maintaining spatial resolution. However, at high qubit densities, inter-qubit interactions induce complex many-body dynamics, resulting in multiple oscillations in the expectation value of the observable even for small field amplitudes. This ambiguity reduces the dynamic range of the sensing protocol. We propose a method to overcome the limitation in quantum metrology by adopting a quantum circuit learning framework using a parameterized quantum circuit to approximate a target function by optimizing the circuit parameters. In our method, after the qubits interact with the external field, we apply a sequence of parameterized quantum gates and measure a suitable observable. By optimizing the gate parameters, the expectation value is trained to exhibit a monotonic response within a target range of field amplitudes, thereby eliminating multiple oscillations and enhancing the dynamic range. This method offers a strategy for improving quantum sensing performance in dense qubit systems.
Abstract:NISQ (Noisy, Intermediate-Scale Quantum) computing requires error mitigation to achieve meaningful computation. Our compilation tool development focuses on the fact that the error rates of individual qubits are not equal, with a goal of maximizing the success probability of real-world subroutines such as an adder circuit. We begin by establishing a metric for choosing among possible paths and circuit alternatives for executing gates between variables placed far apart within the processor, and test our approach on two IBM 20-qubit systems named Tokyo and Poughkeepsie. We find that a single-number metric describing the fidelity of individual gates is a useful but imperfect guide. Our compiler uses this subsystem and maps complete circuits onto the machine using a beam search-based heuristic that will scale as processor and program sizes grow. To evaluate the whole compilation process, we compiled and executed adder circuits, then calculated the KL-divergence (a measure of the distance between two probability distributions). For a circuit within the capabilities of the hardware, our compilation increases estimated success probability and reduces KL-divergence relative to an error-oblivious placement.