Alert button
Picture for Shin-ya Takemura

Shin-ya Takemura

Alert button

Latent Feature Representation via Unsupervised Learning for Pattern Discovery in Massive Electron Microscopy Image Volumes

Add code
Bookmark button
Alert button
Dec 22, 2020
Gary B Huang, Huei-Fang Yang, Shin-ya Takemura, Pat Rivlin, Stephen M Plaza

Figure 1 for Latent Feature Representation via Unsupervised Learning for Pattern Discovery in Massive Electron Microscopy Image Volumes
Figure 2 for Latent Feature Representation via Unsupervised Learning for Pattern Discovery in Massive Electron Microscopy Image Volumes
Figure 3 for Latent Feature Representation via Unsupervised Learning for Pattern Discovery in Massive Electron Microscopy Image Volumes
Figure 4 for Latent Feature Representation via Unsupervised Learning for Pattern Discovery in Massive Electron Microscopy Image Volumes
Viaarxiv icon