Adaptive Optimizable Gaussian Process Regression Linear Least Squares Regression Filtering Method for SEM Images

Scanning Electron Microscopy (SEM) images often suffer from noise contamination, which degrades image quality and affects further analysis. This research presents a complete approach to estimate their Signal-to-Noise Ratio (SNR) and noise variance (NV), and enhance image quality using NV-guided Wiener filter. The main idea of this study is to use a good SNR estimation technique and infuse a machine learning model to estimate NV of the SEM image, which then guides the wiener filter to remove the noise, providing a more robust and accurate SEM image filtering pipeline. First, we investigate five different SNR estimation techniques, namely Nearest Neighbourhood (NN) method, First-Order Linear Interpolation (FOL) method, Nearest Neighbourhood with First-Order Linear Interpolation (NN+FOL) method, Non-Linear Least Squares Regression (NLLSR) method, and Linear Least Squares Regression (LSR) method. It is shown that LSR method to perform better than the rest. Then, Support Vector Machines (SVM) and Gaussian Process Regression (GPR) are tested by pairing it with LSR. In this test, the Optimizable GPR model shows the highest accuracy and it stands as the most effective solution for NV estimation. Combining these results lead to the proposed Adaptive Optimizable Gaussian Process Regression Linear Least Squares Regression (AO-GPRLLSR) Filtering pipeline. The AO-GPRLLSR method generated an estimated noise variance which served as input to NV-guided Wiener filter for improving the quality of SEM images. The proposed method is shown to achieve notable success in estimating SNR and NV of SEM images and leads to lower Mean Squared Error (MSE) after the filtering process.

Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review

Scanning Electron Microscopy (SEM) is critical in nanotechnology, materials science, and biological imaging due to its high spatial resolution and depth of focus. Signal-to-noise ratio (SNR) is an essential parameter in SEM because it directly impacts the quality and interpretability of the images. SEM is widely used in various scientific disciplines, but its utility can be compromised by noise, which degrades image clarity. This review explores multiple aspects of the SEM imaging process, from the principal operation of SEM, sources of noise in SEM, methods for SNR measurement and estimations, to various aspects that affect the SNR measurement and approaches to enhance SNR, both from a hardware and software standpoint. We review traditional and emerging techniques, focusing on their applications, advantages, and limitations. The paper aims to provide a comprehensive understanding of SNR optimization in SEM for researchers and practitioners and to encourage further research in the field.