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Haebom Lee

SREL: Severity Rating Ensemble Learning for Non-Destructive Fault Diagnosis of Cu Interconnects using S-parameter Patterns

Apr 20, 2023
Tae Yeob Kang, Haebom Lee, Sungho Suh

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* Submitted to IEEE Transactions on Instrumentation and Measurement, 9 pages

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Spatio-Temporal Outdoor Lighting Aggregation on Image Sequences using Transformer Networks

Feb 18, 2022
Haebom Lee, Christian Homeyer, Robert Herzog, Jan Rexilius, Carsten Rother

* 11 pages, 7 figures, 1 table, currently under a review process

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