Attention Modules Improve Modern Image-Level Anomaly Detection: A DifferNet Case Study

Within (semi-)automated visual inspection, learning-based approaches for assessing visual defects, including deep neural networks, enable the processing of otherwise small defect patterns in pixel size on high-resolution imagery. The emergence of these often rarely occurring defect patterns explains the general need for labeled data corpora. To not only alleviate this issue but to furthermore advance the current state of the art in unsupervised visual inspection, this contribution proposes a DifferNet-based solution enhanced with attention modules utilizing SENet and CBAM as backbone - AttentDifferNet - to improve the detection and classification capabilities on three different visual inspection and anomaly detection datasets: MVTec AD, InsPLAD-fault, and Semiconductor Wafer. In comparison to the current state of the art, it is shown that AttentDifferNet achieves improved results, which are, in turn, highlighted throughout our quantitative as well as qualitative evaluation, indicated by a general improvement in AUC of 94.34 vs. 92.46, 96.67 vs. 94.69, and 90.20 vs. 88.74%. As our variants to AttentDifferNet show great prospects in the context of currently investigated approaches, a baseline is formulated, emphasizing the importance of attention for anomaly detection.

Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study

Within (semi-)automated visual industrial inspection, learning-based approaches for assessing visual defects, including deep neural networks, enable the processing of otherwise small defect patterns in pixel size on high-resolution imagery. The emergence of these often rarely occurring defect patterns explains the general need for labeled data corpora. To alleviate this issue and advance the current state of the art in unsupervised visual inspection, this work proposes a DifferNet-based solution enhanced with attention modules: AttentDifferNet. It improves image-level detection and classification capabilities on three visual anomaly detection datasets for industrial inspection: InsPLAD-fault, MVTec AD, and Semiconductor Wafer. In comparison to the state of the art, AttentDifferNet achieves improved results, which are, in turn, highlighted throughout our quali-quantitative study. Our quantitative evaluation shows an average improvement - compared to DifferNet - of 1.77 +/- 0.25 percentage points in overall AUROC considering all three datasets, reaching SOTA results in InsPLAD-fault, an industrial inspection in-the-wild dataset. As our variants to AttentDifferNet show great prospects in the context of currently investigated approaches, a baseline is formulated, emphasizing the importance of attention for industrial anomaly detection both in the wild and in controlled environments.