Abstract:Metasurface-based radar absorbing structures (RAS) are highly preferred for applications like stealth technology, electromagnetic (EM) shielding, etc. due to their capability to achieve frequency selective absorption characteristics with minimal thickness and reduced weight penalty. However, the conventional approach for the EM design and optimization of these structures relies on forward simulations, using full wave simulation tools, to predict the electromagnetic (EM) response of candidate meta atoms. This process is computationally intensive, extremely time consuming and requires exploration of large design spaces. To overcome this challenge, we propose a surrogate model that significantly accelerates the prediction of EM responses of multi-layered metasurface-based RAS. A convolutional neural network (CNN) based architecture with Huber loss function has been employed to estimate the reflection characteristics of the RAS model. The proposed model achieved a cosine similarity of 99.9% and a mean square error of 0.001 within 1000 epochs of training. The efficiency of the model has been established via full wave simulations as well as experiment where it demonstrated significant reduction in computational time while maintaining high predictive accuracy.
Abstract:Advancements in optical quantum technologies have been enabled by the generation, manipulation, and characterization of light, with identification based on its photon statistics. However, characterizing light and its sources through single photon measurements often requires efficient detectors and longer measurement times to obtain high-quality photon statistics. Here we introduce a deep learning-based variational autoencoder (VAE) method for classifying single photon added coherent state (SPACS), single photon added thermal state (SPACS), mixed states between coherent/SPACS and thermal/SPATS of light. Our semisupervised learning-based VAE efficiently maps the photon statistics features of light to a lower dimension, enabling quasi-instantaneous classification with low average photon counts. The proposed VAE method is robust and maintains classification accuracy in the presence of losses inherent in an experiment, such as finite collection efficiency, non-unity quantum efficiency, finite number of detectors, etc. Additionally, leveraging the transfer learning capabilities of VAE enables successful classification of data of any quality using a single trained model. We envision that such a deep learning methodology will enable better classification of quantum light and light sources even in the presence of poor detection quality.