SAGE-GAN: Towards Realistic and Robust Segmentation of Spatially Ordered Nanoparticles via Attention-Guided GANs

Precise analysis of nanoparticles for characterization in electron microscopy images is essential for advancing nanomaterial development. Yet it remains challenging due to the time-consuming nature of manual methods and the shortcomings of traditional automated segmentation techniques, especially when dealing with complex shapes and imaging artifacts. While conventional methods yield promising results, they depend on a large volume of labeled training data, which is both difficult to acquire and highly time-consuming to generate. In order to overcome these challenges, we have developed a two-step solution: Firstly, our system learns to segment the key features of nanoparticles from a dataset of real images using a self-attention driven U-Net architecture that focuses on important physical and morphological details while ignoring background features and noise. Secondly, this trained Attention U-Net is embedded in a cycle-consistent generative adversarial network (CycleGAN) framework, inspired by the cGAN-Seg model introduced by Abzargar et al. This integration allows for the creation of highly realistic synthetic electron microscopy image-mask pairs that naturally reflect the structural patterns learned by the Attention U-Net. Consequently, the model can accurately detect features in a diverse array of real-world nanoparticle images and autonomously augment the training dataset without requiring human input. Cycle consistency enforces a direct correspondence between synthetic images and ground-truth masks, ensuring realistic features, which is crucial for accurate segmentation training.

F-ANcGAN: An Attention-Enhanced Cycle Consistent Generative Adversarial Architecture for Synthetic Image Generation of Nanoparticles

Nanomaterial research is becoming a vital area for energy, medicine, and materials science, and accurate analysis of the nanoparticle topology is essential to determine their properties. Unfortunately, the lack of high-quality annotated datasets drastically hinders the creation of strong segmentation models for nanoscale imaging. To alleviate this problem, we introduce F-ANcGAN, an attention-enhanced cycle consistent generative adversarial system that can be trained using a limited number of data samples and generates realistic scanning electron microscopy (SEM) images directly from segmentation maps. Our model uses a Style U-Net generator and a U-Net segmentation network equipped with self-attention to capture structural relationships and applies augmentation methods to increase the variety of the dataset. The architecture reached a raw FID score of 17.65 for TiO$_2$ dataset generation, with a further reduction in FID score to nearly 10.39 by using efficient post-processing techniques. By facilitating scalable high-fidelity synthetic dataset generation, our approach can improve the effectiveness of downstream segmentation task training, overcoming severe data shortage issues in nanoparticle analysis, thus extending its applications to resource-limited fields.