Three-dimensional structure from single two-dimensional diffraction intensity measurement

Conventional three-dimensional (3D) imaging methods require multiple measurements of the sample in different orientation or scanning. When the sample is probed with coherent waves, a single two-dimensional (2D) intensity measurement is sufficient as it contains all the information of the 3D sample distribution. We show a method that allows reconstruction of 3D sample distribution from a single 2D intensity measurement, at the z-resolution exceeding the classical limit. The method can be practical for radiation-sensitive materials, or where the experimental setup allows only one intensity measurement.