We present a new imaging technique, swept-angle synthetic wavelength interferometry, for full-field micron-scale 3D sensing. As in conventional synthetic wavelength interferometry, our technique uses light consisting of two optical wavelengths, resulting in per-pixel interferometric measurements whose phase encodes scene depth. Our technique additionally uses a new type of light source that, by emulating spatially-incoherent illumination, makes interferometric measurements insensitive to global illumination effects that confound depth information. The resulting technique combines the speed of full-field interferometric setups with the robustness to global illumination of scanning interferometric setups. Overall, our technique can recover full-frame depth at a spatial and axial resolution of a few micrometers using as few as 16 measurements, resulting in fast acquisition at frame rates of 10 Hz. We build an experimental prototype and use it to demonstrate these capabilities, by scanning a variety of scenes that contain challenging light transport effects such as interreflections, subsurface scattering, and specularities. We validate the accuracy of our measurements by showing that they closely match reference measurements from a full-field optical coherence tomography system, despite being captured at orders of magnitude faster acquisition times and while operating under strong ambient light.