A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. The method uses the concept of integrated centre of mass (iCOM) and creates a live-updated image based on diffraction patterns collected at each probe position during scanning. It is shown that the method has similar characteristics to the traditional iCOM approach. However, by reformulating the integration method, the reconstruction process can be divided into sub-units, with each unit requiring only information from a single probe position, such that the resulting image can be updated each time a new probe position is visited without storing any intermediate diffraction patterns. As a certain position in the image is only influenced by its surrounding pixels in the immediate vicinity, the image update provides interpretable images being build up while the scanning is being performed. The results show clearer features at higher spatial frequency, such as atomic column positions. It is also demonstrated that common post processing methods, such as a band pass filter, can be directly integrated in the real time processing flow. By comparing with other reconstruction methods, it is shown that the proposed method can produce high quality reconstructions with good noise robustness at extremely low memory and computational requirements. We further present an efficient, interactive open source implementation of the concept, compatible with frame-based, as well as event-based camera/file types. The proposed method provides the attractive feature of immediate feedback that microscope operators have become used to for e.g. conventional HAADF STEM imaging allowing for rapid decision making and fine tuning to obtain the best possible images for beam sensitive samples at the lowest possible dose.