We investigate the problem of identity testing for multidimensional histogram distributions. A distribution $p: D \rightarrow \mathbb{R}_+$, where $D \subseteq \mathbb{R}^d$, is called a {$k$-histogram} if there exists a partition of the domain into $k$ axis-aligned rectangles such that $p$ is constant within each such rectangle. Histograms are one of the most fundamental non-parametric families of distributions and have been extensively studied in computer science and statistics. We give the first identity tester for this problem with {\em sub-learning} sample complexity in any fixed dimension and a nearly-matching sample complexity lower bound. More specifically, let $q$ be an unknown $d$-dimensional $k$-histogram and $p$ be an explicitly given $k$-histogram. We want to correctly distinguish, with probability at least $2/3$, between the case that $p = q$ versus $\|p-q\|_1 \geq \epsilon$. We design a computationally efficient algorithm for this hypothesis testing problem with sample complexity $O((\sqrt{k}/\epsilon^2) \log^{O(d)}(k/\epsilon))$. Our algorithm is robust to model misspecification, i.e., succeeds even if $q$ is only promised to be {\em close} to a $k$-histogram. Moreover, for $k = 2^{\Omega(d)}$, we show a nearly-matching sample complexity lower bound of $\Omega((\sqrt{k}/\epsilon^2) (\log(k/\epsilon)/d)^{\Omega(d)})$ when $d\geq 2$. Prior to our work, the sample complexity of the $d=1$ case was well-understood, but no algorithm with sub-learning sample complexity was known, even for $d=2$. Our new upper and lower bounds have interesting conceptual implications regarding the relation between learning and testing in this setting.